MICRO
TEST
French distributor of equipment and consumables for the Semiconductor industry.
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Our Equipment
Front-End
Deposition of Thin Films
Sputtering/PVD
Evaporation (PVD)
CVD/PE-CVD
ALD | High-Speed Systems for Advanced R&D and Production
ALD | Compact Systems
Wafer Cleaning
Atmospheric Plasma Cleaning
Wet Process
Photolithography
Spin Coater & Spray Coater
Hot Plates
Clusters
Laser Lithography
UV-LED Exposure Systems and Mask Aligners
Engraving
Ion Etching/Milling
Ovens, Drying Ovens
Processing and Annealing Furnaces
High-Temperature Furnaces
Temperature chambers
Assembly
Wafer Assembly
Wafer Mounting on Tape (Wafer Mounter)
Cutting
Manual Scriber
Semi-auto Scriber & Breaker (S100)
Post-Cutting Cleanup
Automatic Wafer Cleaner
UV Exposure
Automatic UV Curing System
Manual UV Exposure System (Lamps or LEDs)
Sorting and Micro-Wiring
Manual Pick & Place (Die Bonder)
Semi-Automatic Pick & Place (Die Bonder)
Fully Automatic Pick & Place (Die Bonder)
Micro Ultrasonic Wire Bonder (Wire Bonding)
Laser Systems
Laser Trimmer
Laser Marking / Drilling / Cutting
Screen printing
Screen printer
Ovens, Drying Ovens
Batch Furnaces and Conveyor Furnaces
Temperature chambers
Brazing and reflow ovens
Test
Pin-Point Testing/Prober
Manual Probers
Semi-Automatic Probers
Automatic Probers
Probe Station Accessories
Probe Cards
Micro Test Chambers / Microprobes
Micro Probe Test Chamber
Test Microchamber for LCC Chips
Optical Micro-Chamber
Vertical Raman Electrochemical Reactor
Scanning Microscope Sample Holder
Temperature Test
Chiller (Air-Cooled Chiller)
Temperature Conditioners (Thermal Stream)
Temperature chambers
Heating plates
Other tests
Burn-In (Aging Test)
HAST Test
Leak Testing
Optical Test
Photonics Testing Solutions (Photonics Automation Probers)
Automatic Die Sorters
Optical Inspection: AOI Systems
Component Test - Handler
Chroma 3210 (Handler)
Chroma 3160 C (Handler)
Chroma 3111 (Handler)
Chroma 3260 (Handler)
Chroma 3180 (Handler)
Chroma 3110 Gen2 (Handler)
Consumables and Tools
Packaging
Film Frames for Wafers
Single wafer shippers for wafers on frames or rings
Magazines for Wafers on Frames or Rings
Grip Rings (GRP) – Plastic rings for wafers
Handling
Wafer tweezers
Tweezers
Cutters and Pliers
Vacuum Handling
Taken by vacuum – wafers
Vacuum pick-up – components and small parts
Vacuum pick-up consumables: suction cups
Die bonding – Bonding test
Bonding tools: holders
Picking tools
Wire Bond Testing Tools
Spare Parts
Spare Parts
Our services
Installation/Training
After-Sales Service
Preventive and Corrective Maintenance
Calibration, Temperature Calibration
Equipment Rental
Our partners
Front-end equipment
Assembly equipment
Test equipment
Consumables
About
Our team
Our History
Our Company
Our Partners
Location
Environment
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English
French
Micro test chamber (MICROPROBE) under spikes
4-probe test microchamber
for
X-ray diffractometry
RF Test Microchamber
with 2 GSG Probes
(80K to +450°C option)
Motorized Probe
Test Microchamber
(80K to +1000°C option)
Microtest Chamber
Manual Probes
(80K to +1000°C option)
