Chroma 3110 Gen2 (Handler)
Final Test Handler – Component characterization / qualification / validation
Applications
A solution dedicated to characterization and advanced thermal testing
The Chroma 3110-FT is an automated thermal handler designed for characterization, qualification, and validation of semiconductor components.
With active thermal control covering a range from -40°C to +125°C, it faithfully reproduces real-world component operating conditions to evaluate performance in the most demanding environments.
Particularly suited for development laboratories, qualification centers, and production lines requiring precise thermal testing, the system supports a wide range of packages such as QFP, SOP, TSSOP, QFN, and BGA. Its automated handling architecture ensures excellent repeatability of test operations while reducing risks associated with manual handling.
Combined with the Chroma Hybrid Chiller & TEC Controller system, the 3110-FT can control both case temperature and junction temperature, a highly sought-after feature in advanced characterization and tri-temperature validation applications.
Spécifications
A platform designed for thermal precision
The Chroma 3110-FT combines handling flexibility and thermal stability to ensure reliable results throughout the test cycle.
Key features:
- System compatible for component Final Test (FT) and System Level Test (SLT)
- Best engineering platform for tri-temperature characterization testing
- Thermal range: -40°C to +125°C
- Socket Temperature Compensation Module (STCM)
- Thermal accuracy at contact head: ±2°C
- Components from 3 × 3 mm to 45 × 45 mm
- Up to 4 output bins
- Compatibility with QFP, SOP, TSSOP, QFN, and BGA packages
- Yield monitoring function
- Intelligent automatic retest and retry
- Real-time tray status
- TSD control support
- Maximum throughput: up to 500 units per hour
- Component thickness: 0.5 to 5 mm
- Direct contact or Drop & Press technology
- Standard contact force: 50 kgf
- Adjustable force from 1 to 10 kgf (option) Index time: 6 seconds
- Remote control via RS-232 and TCP/IP interfaces
- GPIB and TTL options available
The integration of thermal pre-conditioning zones improves component stability before reaching the test socket, thereby reducing temperature deviations and improving measurement repeatability.
Démonstration / location
Features designed for qualification environments
The 3110-FT integrates several tools to simplify test campaigns and improve equipment operation.
Remote control and monitoring
The system can be remotely controlled and offers production tracking functions, allowing operators to monitor handler status, test yield, and tray occupancy in real time.
Intelligent test management
To improve operational efficiency, the 3110-FT features:
- Auto-Retest
- Auto-Retry
- Yield monitoring
- Real-time tray status tracking
Thermal test optimization
Several options allow the system to be precisely adapted to user needs:
- Adjustable contact force control
- STCM (Socket Temperature Compensation Module)
- TSD/PTSD control
- Integration with Chroma Hybrid Chiller
- System Level Test (SLT) compatibility
Production flexibility
The handler can manage up to four sorting trays and reach a throughput of 500 components per hour, offering an efficient combination of thermal precision, automation, and productivity.
The Chroma 3110-FT is an ideal solution for manufacturers and laboratories seeking equipment dedicated to thermal testing, electrical characterization, and component qualification requiring precise temperature control throughout the test cycle.