Chroma 3180 (Handler)
FT Handler - Very High Production Volumes
Applications
A Test Platform Designed for Very High Volumes
The Chroma 3180 is a new-generation automatic handler designed for semiconductor final test applications requiring a high level of productivity and availability. Developed for high-volume manufacturing environments, it automates the entire component handling flow, from tray loading to final sorting after testing.
Thanks to its scalable multi-site architecture, the system allows simultaneous testing of multiple components to optimize ATE resource utilization and significantly reduce the cost of test per part. This approach makes it a particularly suitable solution for production lines seeking a balance between high speed, contact quality, and operational reliability.
Compatible with most packages used in the semiconductor industry, including BGA, QFN, QFP, CSP, Flip-Chip, and TSOP, the Chroma 3180 supports both consumer production and industrial and automotive applications requiring high test performance.
Spécifications
Performance That Makes a Difference
Designed for intensive production environments, the Chroma 3180 combines handling speed, mechanical robustness, and configuration flexibility.
Key Figures
- Configurations available up to 8 simultaneous test sites
- Flexible test site configuration
- Productivity up to 9,000 components per hour
- Component formats from 3 × 3 mm to 50 × 50 mm
- Indexing time of only 0.4 seconds
- Contact force up to 120 kgf
- Temperature testing from ambient to 150 °C
- Compatibility with standard JEDEC trays
- Direct contact or Drop & Press technology
- Extremely low jam rate: 1 component in 10,000
- TTL and GPIB interfaces as standard
- RS232 and TCP/IP available for integration into automated lines
This architecture ensures precise component positioning on test sockets while limiting mechanical stresses that could affect sensitive components or reduce the lifespan of contact interfaces.
Démonstration / location
Advanced Features for Maximizing Throughput
The Chroma 3180 is not limited to speed. It also integrates several features designed to improve production quality and equipment availability.
Optimal Utilization of Test Resources
Quad Site and Octal Site configurations enable full utilization of modern ATE system capacity by performing multiple tests in parallel. This approach helps reduce the overall cost of ownership while increasing production throughput.
Intelligent Binning Management
The system supports up to six binning categories, simplifying the separation of validated, rejected, or further analysis-required components.
Reduced Operator Intervention
The handler integrates functions for:
- Intelligent Auto Re-test and Auto-retry
- Yield Monitoring
These tools improve the traceability of test campaigns while limiting production interruptions.
Component and Socket Preservation
The cushioned contact mechanism, combined with high-precision alignment, reduces socket wear and minimizes the risk of mechanical damage to components during handling phases.
Upgrade Options
To meet more specific qualification needs, the 3180 can also be equipped with:
An automatic socket cleaning function
High-temperature testing capability up to approximately 150°C
Advanced communication interfaces for integration into connected production lines
The Chroma 3180 thus represents a benchmark solution for manufacturers seeking to significantly increase their test capacity while maintaining a high level of quality, repeatability, and industrial reliability.