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Blog Category: Test

February 19, 2026

High-Power Wafer Testing: Technical Challenges and Advanced Solutions

When power comes to the wafer The rapid evolution of power electronics - GaN, SiC, high-power LEDs, integrated drivers or energetic RF circuits - has profoundly transformed wafer testing requirements. Testing a high-power component before it is

January 9, 2026

The new compact and modular TA-3000U temperature conditioner

TA-3000A giraffe model, a benchmark The TA-3000A and TA-3000B temperature conditioners: benchmarks for thermal testing Giraffes TA-3000A et TA-3000B MPI Thermal products are essential solutions for the rapid and precise thermal control of electronic, optical and RF