Chroma 3111 (Handler)
SLT Handler – R&D Applications
Applications
Compact handler for SLT and product validation
The Chroma 3111 is an automated single-site handler developed for System Level Test (SLT) applications, New Product Introduction (NPI) validation, and qualification environments requiring a high level of automation.
Designed for both development laboratories and low-to-medium volume production, it automates component handling while ensuring precise and repeatable positioning during test operations.
Thanks to its compact format, the 3111 integrates easily into laboratory spaces, characterization zones, or existing test cells. Compatible with a wide range of packages, such as BGA, QFN, QFP, TSOP, and Flip-Chip, it offers great flexibility to support technological evolutions in electronic components.
Automatic feeding via JEDEC trays, combined with a handling system specifically designed to preserve component integrity, contributes to improved productivity while reducing error risks associated with manual operations. The Chroma 3111 is thus an ideal solution for semiconductor manufacturers seeking reliable, compact, and easy-to-deploy equipment.
Specifications
Key technical points
The Chroma 3111 combines mechanical precision and flexibility to meet the requirements of modern test applications:
- Tabletop design for a reduced 60 cm² footprint: Compact format facilitating integration into laboratory and production environments
- (2) Fixed JEDEC trays
- Test interface window accommodating test boards measuring up to 200 mm (W) x 200 mm (D)
- Support for components from 5 x 5 mm to 45 x 45 mm
- Compatibility with BGA, QFN, QFP, TSOP, and Flip-Chip packages
- Supported component thickness from 0.5 to 5 mm
- Test temperature from ambient up to 125°C
- Adjustable contact force from 10 to 50 kgf
- Component rotation up to ±90°
- Software binning up to 128 sorting categories
- TCP/IP and RS-232 communication interfaces, with GPIB option
- Software-configurable category classification
- Pneumatic shock-absorbing contact head
- Optimized balance of forces exerted on integrated circuits
- Protection against IC stacking and incorrect component placement or orientation
- Continuous automated retest capabilities
This architecture enables repeatable test results while ensuring excellent operational stability and low operator intervention frequency.
Demo / Rental
Advanced features and available options
To enhance test run reliability and improve operational efficiency, the Chroma 3111 can be equipped with several optional features:
Intelligent loading control
A CCD camera can be integrated to automatically verify component presence in the socket and detect double-loading situations before test initiation. This function helps protect contact interfaces and reduce the risk of errors.
Automatic retest management
The system features an automatic retest function allowing certain components to be rerun without manual intervention, which is particularly useful during product qualification or validation phases.
Advanced component sorting
The integrated binning software offers up to 128 classification categories, facilitating the separation of conforming, non-conforming, or components requiring further analysis.
Simplified integration with existing infrastructure
To meet test line integration constraints, the 3111 can be fitted with an optional GPIB interface ensuring compatibility with many already installed ATE systems.
Component and test interface protection
The system includes orientation control functions, optimized contact force management, and gentle handling to extend socket life while preserving the integrity of the tested components.
The Chroma 3111 thus offers an effective combination of compactness, ease of use, and reliability, perfectly suited for validation, qualification, and System Level Test environments requiring high-performance automation without the constraints of a high-speed production handler.