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Test Burn In

HPB-4B High-Power Burn-In System

High-power devices have become an industry standard. The HPB-4B burn-in system meets the challenges created by wide variations in heat dissipation and the diverse burn-in requirements of high-power devices:

  • Individual temperature control for each device up to 600 W
  • Device testing at a maximum temperature of 150°C with one liquid-cooled heatsink per device.
  • Programmable clock with 2 nanosecond resolution and 8 sets of on-the-fly synchronization.
  • System capacity: 14 burn-in cards (112 devices)
  • 12 vector formats per cycle with memory test extensions
  • 19 programmable voltage regulators delivering 2060 amperes per burn-in card.
  • Programmable high-speed clock up to 800 MHz
  • 128 I/O signals per card
  • 64M vector memory, 8G scan
Systeme De Burn In Haute
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HPB-5C+ Burn-In System: The industry standard for high-power circuits The HPB-5C+ test and burn-in system meets the challenges created by the wide variation in thermal dissipation and the diverse burn-in requirements of high-power VLSI devices. The active thermal control function provided by the HPB-5C+ ensures that the appropriate thermal stress is applied to each device during the burn-in cycle.
  • Individual temperature control for each device up to 150 W
  • Variable oven overflow control
  • Individual burn-in zone
  • 32M vector memory as standard, 64M optional
  • Tests devices at temperatures up to 150°C
  • Clock frequency up to 800 MHz
  • 128 digital I/O channels per burn-in card
  • System capacity: 384 devices under test with individual temperature control per device.
  • 16 programmable voltage regulators with 1080 amperes of device power under test per burn-in card
  • 8 high-current power supplies (0-4 volts at a maximum of 125 amps each)
  • 8 low-current power supplies (0-6 volts at a maximum of 10 amps each)
Systeme De Burn In HPB 5C
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The LC-2+ Burn-In system: production burn-in and individual temperature control The LC-2+ is a sophisticated burn-in system that meets advanced requirements thanks to its ability to perform dynamic burn-in with test. The LC-2+ is ideally suited to technical characterization, service life testing and production control applications. The main function of the LC-2+ is to provide appropriate temperature, voltage and current conditions to identify device functionality during burn-in.
  • Large capacity: 64 burners
  • Individual temperature control up to 50 watts, compatible with a wide range of BIB sizes
  • 128 or 256 digital I/O channels per burn-in card
  • 5 individually programmable power supplies (up to 400 watts and 248 amps) per burn-in card.
  • Up to 150 volts of power outputs
  • Up to 32 configuration and supply zones
  • Total flexibility up to 8M vector memory with BIB scanning capability
Le Systeme Burn In LC 2
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The Burn-In LC-2 Automation system: Next-generation automation

The new-generation LC-2 Automation system is ideally suited to technical characterization, life testing and running-in applications in commercial production.

  • The machine can operate in two modes:
    • Fully automated
    • Manual operation
  • Automated sliding door
  • BIB rack positioning system
  • Automated BIB loading and ejection
  • Standard safety circuit features include
    • Immaterial barriers
    • Door bumpers
    • Position sensors
Le Systeme Burn In LC 2 2
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