MICRO
TEST
distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.
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Our equipment
Front-End
Deposition of thin layers
Sputtering/Pulverization (PVD)
Atomic Layer Deposition (ALD)
Evaporation (PVD)
CVD/PE CVD
Wafer cleaning
Atmospheric plasma cleaning
Wet Process
Photo lithographie
Spin coater and Spray Coater
Hot plates
Clusters
Laser photolithography
Insolators
Mask Aligner
Gravure
Plasma etching
Engraving/Ionic machining
Fours, Ovens
Treatment and annealing furnaces (RTP and VPO)
High-temperature ovens
Ovens, incubators
Assemblage
Assembling you wafer
Wafer mounting on tape (Wafer Mounter)
Wafer Bonding/Debonding
Cutting
Manual Scriber
Semi-auto Scriber & Breaker
Post sawing cleaning
Automatic Wafer Cleaner
Insolation UV
Manual UV Insulator
UV Auto Insulator
Sorting and Micro-Wiring
Semi-automatic Pick Place (Die Bonder)
Full-Automatic Pick Place (Die Bonder)
Pick Place Manuel (Die Bonder)
Micro ultrasonic wire bonder
Laser systems
Laser marking/drilling/cutting
Laser Trimer
Screen printing
Screen printer
Fours, Ovens
Soldering/reflow furnaces (RSO, RSS and VSS)
Passage Furnaces
Static ovens
Temperature chambers
Test
Test under tips/Prober
Probers Manuals
Semi-automatic Probers
Automatic Probers
Test accessories
Tip cards
Temperature Test
Cooling unit (chiller, air-conditioning cooler)
Temperature conditioners (Girafe, Thermal Stream)
Temperature Chamber
Hot plates
Other Tests
Test Burn In
HAST test
Leak Test
Optical Test
Automatic Photonic Probers
Photonic Sorters
AOI system
Consumables and Tools
Packaging
Film frames – Cadres pour wafers
Individual boxes for wafers on frames or rings
Magazines for wafers on frames or rings
Grip Rings (GRP) – Plastic rings for wafers
Manipulation
Wafer grippers
Tweezers
Cutting and folding pliers
Handling when empty
Taken by vacuum – wafers
Vacuum pick-up – components and small parts
Vacuum grip consumables: suction cups
Die bonding – Bonding test
Bonding tools: holders
Picking tools
Bond testing tools
Detached parts
Spare parts
Our services
Installation/formation
SAV
Preventive and corrective maintenance
Calibration, temperature calibration
Equipment rental
Our partners
Front-end equipment
Assembly Equipment
Test Equipment
Consumables
About us
Our team
Our history
Our enterprise
Our partners
Localisation
Environnement
News
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Blog Category: ATOMIC LAYER DEPOSITION
March 22, 2024
AT200M
February 26, 2024
AT410/610/810
February 26, 2024
AT650 thermal or plasma
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Recent Posts
Microtest joins ALPHA RLH Competitiveness Cluster
Microtest: committed to workplace safety
New products in our consumables range: Testing Tweezers
MICROTEST and Encapsulix: Innovative synergy for the semiconductor industry
Microtest at Minalogic Business Meetings 2024: innovation and expertise in microelectronics