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IC support tape inspection

Carrier Tape AOI

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Designed to meet the growing demands of the IC packaging industry, the automatic carrier tape inspection (AOI) machine enables fast and accurate detection of defects on multiple tapes simultaneously.

Thanks to its high-resolution industrial vision system and advanced traceability features, this machine is an essential tool for ensuring the quality of ribbons used in semiconductor (IC) packaging. It is particularly suitable for 8 mm to 12 mm ribbons, whether transparent, black, or white, and can handle up to 6 ribbons simultaneously, with speeds of up to 24 meters per minute.

  • Multi-tape inspection: up to 6 backing tapes inspected in parallel
  • High inspection speed: up to 24 m/min
  • 2MP industrial camera
  • 150 frames/second, 11 µm resolution
  • Multiple defect detection: inspection of P2, F, E, P0, X0, and Y0 types
  • Automatic data archiving: sorting of results by date, tape, and defect type
  • Real-time trend graphs: dynamic display of the last 1000 measurements
  • Automatic defect marking and photo recording
  • Three operating modes: production, engineering (live image), and setup
  • Structured quality control: classification of defects on 5 tolerance levels
  • 10 modules Inspections available as needed

Thanks to its three operating modes (production, engineering, tuning) and its ability to dynamically adjust tolerances according to expected quality levels, the machine allows for rapid adaptation to the specific requirements of each production line.

Automatic traceability by date and tape type provides effective quality monitoring throughout the entire process, facilitating the identification of deviations or recurring defects.


Connect with our expert
Laurent BEDDELEM
laurent.beddelem@microtest-semi.com
06.34.10.75.23

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