MICRO
TEST
French distributor of equipment and consumables for the Semiconductor industry.
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Our equipment
Front-End
Deposition of thin layers
Sputtering/Pulverization (PVD)
Evaporation (PVD)
CVD/PE-CVD
Wafer cleaning
Wafer cleaning
Photo lithographie
Spin coater & spray coater
Hot plates
Clusters
Laser photolithography
LED maskers and mask aligners
Gravure
Plasma etching/Ionic machining
Fours, Ovens
Treatment and annealing furnaces (RTP and VPO)
Ovens, incubators
Assemblage
Assembling you wafer
Wafer mounting on tape (Wafer Mounter)
Cutting
Semi-automatic Scriber & Breaker (S100)
Manual Scriber
Post sawing cleaning
Automatic Wafer Cleaner
Insolation UV
Manual UV curing (lamps or LEDs)
Auto UV curing (UV-9200/UV-9300)
Sorting and Micro-Wiring
Semi-automatic Pick Place (Die Bonder)
Full-Automatic Pick Place (Die Bonder)
Pick Place Manuel (Die Bonder)
Micro ultrasonic wire bonder
Laser systems
Laser Trimer
Laser marking/drilling/cutting
Screen printing
Screen printer
Fours, Ovens
Static and continuous furnaces
Temperature chambers
Soldering/reflow furnaces (RSO, RSS and VSS)
Test
Test under tips/Prober
Micro test chambers/ Microprobe
Micro test chamber for LCC chip
Optical microchamber
Vertical electrochemical Raman reactor
Sample holder for scanning microscope
Temperature Test
Cooling unit (chiller, air-conditioning cooler)
Temperature chambers
Hot plates
Other Tests
Burn-In (Aging test)
Leak Test
HAST test
Optical Test
Chip sorters (Automatic Die Sorter)
Test solutions for photonics (Photonics Automation Probers)
Optical inspection: AOI systems
Consumables and Tools
Packaging
Film frames – Cadres pour wafers
Individual boxes for wafers on frames or rings
Magazines for wafers on frames or rings
Grip Rings (GRP) – Plastic rings for wafers
Manipulation
Wafer grippers
Tweezers
Cutting and folding pliers
Handling when empty
Taken by vacuum – wafers
Vacuum pick-up – components and small parts
Vacuum grip consumables: suction cups
Die bonding – Bonding test
Bonding tools: holders
Picking tools
Bond testing tools
Detached parts
Spare parts
Our services
Installation/formation
SAV
Preventive and corrective maintenance
Calibration, temperature calibration
Equipment rental
Our partners
Front-end equipment
Assembly Equipment
Test Equipment
Consumables
About us
Our team
Our history
Our enterprise
Our partners
Localisation
Environnement
News
English
Accessoires de test sous pointes
SiPH probing solutions
Prober RF Titan
MPI cables for point testing
Prober Manipulator
