Tip testing : Tip cards – VC20 and VC43 series

VC20 :

• 20 millimeter ceramic tip card
• Optimized for DC parametric testing, modeling and characterization, and single-site WLR.
• Maximum number of channels: 48
• Test platforms: Keysight 4062, 4072, 4080, Keithley S600, S530, rack and stack configurations.
• Minimum pad size: 30µmx30µm (tunable scrub)
• Contact resistance: less than 1 ohm
• Temperature range: -65°C to 200°C
• Leakage: Less than 5 femtoamps per volt.
• If you need faster stabilization time, see AttoFast
• Can be installed quickly using an interface tool in various interfaces and takes up minimal storage space at the test site.
• Tips can be configured as single or double layer.
• Standard X/Y precision: 10% of buffer size
• Standard Z accuracy +/- 5 microns
• Reparable
• Lifetime Performance: Production customers experience over 10 million contacts on aluminum and copper pads.

VC43 :

• 43 millimeter ceramic probe card
• Optimized for DC parametric testing, modeling and characterization, and single-site WLR.
• Can be quickly installed using an interface tool in various interfaces and takes up minimal storage space at the test site.
• Effective operating temperature range of -65° to 200°C
• Leakage as low as 5fA/V
• Can be configured with up to 100 tips
• Tips can be configured as single or double layer.
• Reparable

Celadon Cables :
The cables are designed and manufactured by Celadon. Cables are available in custom lengths up to half a meter and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sleeving may be used to prevent wire wear.

Celadon VersaJet™ with 45EHV :
Electric arc suppression system at nominal temperature of 3kV
The Celadon 45EHV system combined with VersaJet™ allows high voltage tests to be performed at ambient temperatures up to 200°C. No Fluorinert is needed – the VersaJet™ delivers superior performance. The VersaJet™ allows testing at higher voltages by creating a pressure bubble, which not only rubs the surface of the device to remove any particles that may provide an ionization path, but also pressurizes the object under test in order to increase the breakdown voltage.