Wafer Probing: Probe Cards – VC20 and VC43 Series
Probe Cards – VC20 / VC43 / 45EHV Tip Module + Motherboard
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Application
Modeling and characterization, production parametric testing and reliability at the wafer level on a single site
The coin-sized VC20 and VC43 series tip card is an innovative concept to facilitate the handling of tip cards in testing laboratories. The VC20/VC43 module is mounted very simply on its motherboard support. A motherboard can accommodate different configurations of VC20 advanced modules offering numerous advantages:
- Simpler and safer handling of tip modules;
- No more removing the entire tip board on test equipment;
- No more need to disconnect the tip cards from the measuring instruments, the motherboard remains permanently connected and only the tip module is replaced;
- Huge space saving for storing tip cards;
- Tip card repair made easy.
In short, a saving of time, space, ergonomics and safety for handling point cards.
This innovative system is also available in a High Power version allowing tests up to 3 kV up to 200°C: a high-performance and unique solution on the market.
Specifications
VC20:
- 20 mm ceramic probe card
- Optimized for DC parametric testing, modeling and characterization, and WLR on a single site.
- Maximum number of channels: 48
- Test platforms: Keysight 4062, 4072, 4080, Keithley S600, S530, rack and stack configurations.
- Minimum pad size: 30µm x 30µm (tunable scrub)
- Contact resistance: less than 1 ohm
- Temperature range: -65°C to 200°C
- Leakage: less than 5 femtoamps per volt.
- If you need a faster settling time, see AttoFast
- Can be quickly installed using an interface tool in various interfaces and takes up minimal storage space at the test site.
- Tips can be configured in single or double layer.
- Standard X/Y accuracy: 10% of pad size
- Standard Z accuracy +/- 5 microns
- Repairable
- Lifetime performance: Customers in production experience more than 10 million contacts on aluminum and copper pads.
VC43:
- 43 mm ceramic probe card
- Optimized for DC parametric testing, modeling and characterization, and WLR on a single site.
- Can be quickly installed using an interface tool in various interfaces and takes up minimal storage space at the test site.
- Effective operating temperature range from -65° to 200°C
- Leakage as low as 5fA/V
- Can be configured with up to 100 tips
- Tips can be configured in single or double layer.
- Repairable
Complementary products
Celadon Cables:
The cables are designed and manufactured by Celadon. Cables are available in custom lengths up to half a meter and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sleeving may be used to prevent wire wear.
Celadon VersaJet™ with 45EHV:
Electric arc suppression system at nominal temperature of 3kV
The Celadon 45EHV system combined with VersaJet™ allows high voltage tests to be performed at ambient temperatures up to 200°C. No Fluorinert is needed – the VersaJet™ delivers superior performance. The VersaJet™ allows testing at higher voltages by creating a pressure bubble, which not only rubs the surface of the device to remove any particles that may provide an ionization path, but also pressurizes the object under test in order to increase the breakdown voltage.
