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Automatic multi-zone AOI visual inspection machine

High-precision optical inspection for microelectronic and semiconductor components
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The multi-zone visual inspection machine is a high-performance AOI solution, designed for high-speed inspection of electronic components, IC chips, printed circuit boards (PCBs), cut wafers, or precision parts.

Its high-performance software ensures user-friendly operation and ultra-precise results.
Equipped with an artificial intelligence-powered machine learning system, it enables the rapid and reliable detection of defects in appearance, surface, or positioning, with a resolution of up to 1 µm.

Thanks to simultaneous inspection across 10 zones, it is particularly suited to sorting, final testing or online quality control environments in the semiconductor, microelectronics and optoelectronics sectors.

  • Inspection speed: up to 60 parts/s (2M) or 4 parts/s (5M)
  • Inspection area: 2 mm² to 200 mm²
  • Multi-zone inspection: up to 10 simultaneous zones
  • Industrial camera: 2M to 25M pixels
  • Optical resolution: from 1 µm to 50 µm depending on the lens
  • Defect detection: scratches, misalignment, chips, impurities, etc.
  • AI-optimized throughput: real-time OK/NG sorting with self-learning
  • Stable and precise XY motion system

The machine offers excellent flexibility to adapt to different types of parts or substrates, while maintaining advanced detection performance:

  • Suitable for various component types: IC chips, LEDs, substrates, MEMS, PCBs, FPCs
  • Camera and lens configuration can be modified according to the desired accuracy
  • Supports multiple formats without complex reconfiguration
  • AI-based analysis tool with on-the-fly parameter recalculation
  • Simple operator interface for creating/modifying inspection recipes
  • Compatible with automated integration on production lines or as a standalone station
Connect with our expert
Laurent BEDDELEM
laurent.beddelem@microtest-semi.com
06.34.10.75.23

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