distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.

Test solutions for photonics (Photonics Automation Probers)

VEGA, AVIOR, CAPELLA, GEMINI

Parcourir les produits de la gamme

MPI PA redefines excellence in photonic testing with its new product line inspired by the brightest constellations in the sky.

Our commitment to innovation is reflected in every aspect of their solutions,

A complete range for all your needs :

VEGA : Cutting-edge solutions for automotive lighting and backlighting (e.g. Laser Diodes)

AVIOR : Precision testing for optoelectronic communication devices (e.g. Photo Detectors)

GEMINI : Advanced systems for micro display applications including wearables and AR/VR (e.g. Micro LED, Micro display)

CAPELLA : Our most versatile line, covering a wide range of applications (e.g. LED and Mini LED)

Choose MPI PA for photonics test solutions that match your ambitions.

Innovation continue :
With over 20 years of experience and over 10,000 systems deployed worldwide, MPI PA is at the forefront of photonics testing technology.

Clarity and simplicity :
A nomenclature system to quickly identify the key characteristics of each product, simplifying your selection process,

Optimized support :
Discover SIRIUS, the probe control system redesigned for an optimal user experience, comparable to a personal assistant for your tests.

Flexibility and customization :
We adapt to your specific needs, offering tailor-made solutions for your business.

High-performance testing for VCSEL, EEL, PD, LED, OLED, micro and mini LED devices providing high-throughput testing for key device characteristics, including LIV scan curve, far field and Near Field.

Optical flexibility

  • Flexible structure allowing mounting of multiple optical systems for multi-site testing
  • Multiple choices of optics and detectors to precisely meet your optical characteristics testing needs.

Advanced control with MPI Prober Control

  • Comprehensive control functions, from basic wafer alignment to advanced Needle Alignment Mechanism (NAM) technology
  • Intuitive user interface, configurable to your unique testing requirements.

Hot and cold tests

Supports a wide temperature range for testing wafers, packages, and singularized chips, with the ability to handle thin/warped wafers

Precision and performance

  • Probing accuracy of up to ±4 μm depending on the model
  • Fine resolution up to 0.1 μm for the X, Y and Z axes

Adaptability

Different models available to meet your specific needs, with wafer sizes up to 8 inches


Connectez-vous à notre expert
Nicolas Roy
nicolas.roy@microtest-semi.com

Merci d'entrer vos coordonnées pour télécharger la fiche technique.