4-probe test microchamber
for
X-ray diffractometry

Presentation:
The microprobe test chambers are a hyper compact precision measurement tool to analyze the electrical, optical and physical properties of samples at a microscopic scale (dielectric, ionic, semiconductor, electronic) and their interfaces (e.g. grain boundaries and electrodes).

This 4-tip microchamber is dedicated to in situ XRD measurements at high temperature and in vacuum.
The manual tips allow to apply a voltage or read a current.

These measurements can be carried out in the desired environmental conditions of temperature, gas, vacuum, etc. in order to reproduce real in-situ conditions.

Applications:
Applications in various research fields using the microchamber with an XRD chamber:

• In situ analysis of the phase transition as a function of an oxidizing or reducing gas atmosphere (using XRD), and of the electrical properties (using the tips)
• In situ analysis of the changes in the crystal structure as a function of periodic temperature changes of a battery cell
• In situ analysis of the crystal structure of the anode or cathode of a battery cell after a cycle of periodic charges and discharges using the tips
• In situ analysis of the phase transition during the CVD (Chemical Vapor Desposition) process or of changes in the thickness of layers thin.
• In situ analysis of the phase transition when applying a field to the sample at different temperatures
• In situ analysis of the phase transition as a function of temperature (by XRD), and electrical properties (via probes)
• etc.