distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.
distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.
The MPI TS200-IFE/TS300-IFE (IceFreeDEnvironment™) are the result of the development of MPI's IceFreeEnvironment™, combining the convenient "open system" operation of the TS200/300, with the ability to test at sub-zero temperatures (down to -60°C). The design shortens the signal path, making the probe station an ideal choice for mmW and/or load-pull applications.
Universal Use
Ergonomic Design and Options
IceFreeEnvironment™
Incorporating MPI’s IceFreeEnvironment™, the TS200/300-IFE enables testing with MicroPositioners and probe cards simultaneously over a wide temperature range of -60°C to +300°C.
The design shortens the signal path, making the probe station an ideal choice for mmW and/or load-pull applications.
Air-Cushion Stage
The unique design of the MPI Air-Cushion Stage, with simple one-handed operation, provides unmatched user comfort for fast XY navigation and fast wafer loading without compromising the ability to achieve precise and fine positioning with the additional XY-Theta micrometer movement:
Single Stage with Probe Hover Control™
The repeatable (1 μm) stage lift design features three discrete positions for contact, separation (300 μm) and loading (3 mm). The lift incorporates a safety interlock that prevents accidental lowering of the platform. These features provide unmatched functionality and integrate with MPI’s standard manual test systems. This system prevents damage to test tips or wafers and provides intuitive control, precise contact positioning, safe and repeatable settings.
Unique Chuck Z-Position Adjustment
The TS200/300-IFE integrates, in addition to the air-cushioned XY stage, a 5 mm chuck Z-position adjustment with µm resolution for fine and precise contact/overtravel control or probe board placement correction.
A 1 mm scale indicator provides easy feedback to the operator. The 20 mm pneumatic lift also provides an easy and convenient loading/unloading procedure.
Various chuck options
The TS200/300-IFE is available with various chuck options to meet different budgets and application requirements:
Temperature control integration
The wafer loading door is simply locked at any temperature below 15°C - this unique feature makes the TS200/300-IFE the safest manual test stations on the market.
In addition, the thermal chuck can be controlled using the fully integrated touchscreen, located conveniently located in front of the operator for fast operation and immediate feedback.
Integrated ERS patented AC3 cooling technology
These chucks incorporate ERS patented AC3 cooling technology and its air management system to purge the MPI ShielDEnvironment™ directly from "used" air - reducing dry air consumption by up to 30-50% compared to other systems on the market.
Various choices of optics and movements
A wide range of optics are available with a choice of stereo for all common DC/CV applications or high magnification single-tube microscopes for RF or load-pull configurations. High-resolution cameras for optimum comfort are also offered.
Advanced anti-vibration base or table
Shelves for measuring instruments
Probe card holder
Digital micrometers
Compressor and vacuum pump
