distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.
distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.
The TS200-SE/TS300-SE (ShielDEnvironment™) MPIs are designed to provide advanced EMI/RFI/light-tightness shielding, ultra-low noise, low-leakage measurement capabilities in a temperature range of -60 to +300°C.
Universal Use
Designed for a wide variety of applications such as device characterization and modeling, reliability testing, RF and mmW, and failure analysis
Option: High Power Measurement
MPI ShielDEnvironment™ for Accurate Measurements
Ergonomic design and options
Light Curtain Option
ShielDEnvironment™
MPI ShielDEnvironment™ is a high performance local environmental chamber providing an excellent EMI and light shielded test environment for very low noise and low capacitance measurements.
ShielDCap™
A fully configurable part of the MPI ShielDEnvironment™ that allows up to 4 RF ports or up to 8 DC/Kelvin ports or a combination of these configurations.
Easy to reconfigure with a convenient shield that is MPI ShielDCap™ - lots of little things that make a difference in simplifying daily operations.
The complete ShielDCap™ is easily replaceable with the EMI shielded version of a PCB mount tips.
Air-cushion stage
The unique design of the MPI air-cushion stage, with simple one-handed operation, provides unmatched operating comfort for fast XY navigation and fast wafer loading without compromising the precise and fine positioning capability with the additional XY-Theta micrometer movement:
Single Stage with Probe Hover Control™
The repeatable (1 μm) stage lift design features three discrete positions for contact, separation (300 μm), and loading (3 mm). The lift incorporates a safety interlock that prevents accidental platform descent. These features provide unmatched functionality and are standard offerings for the TS200/300-SE handheld probe system. This system prevents damage to test tips or wafers and provides intuitive control, precise contact positioning, safe and repeatable settings.
Unique Chuck Z Position Adjustment
The TS200/300-SE integrates, in addition to the air-cushioned XY stage, a 5 mm chuck Z adjustment with µm resolution for fine and precise contact/overtravel control or probe board placement correction.
A 1 mm scale indicator provides easy feedback to the operator. The 20 mm pneumatic lift also provides an easy and convenient loading/unloading procedure.
Various Chuck Options
The TS200/300-SE is available with various chuck options to meet different budgets and application requirements:
Ambient chucks: Coaxial, Triaxial or RF with two ceramic auxiliary chucks for precise RF calibration.
Various ERS AirCool thermal chucks from -60°C to 300°C.
Temperature Control Integration
The wafer loading door is simply locked at any temperature below 15°C - this unique feature makes the TS200/300-SE the safest manual test station on the market.
In addition, the thermal chuck can be controlled using the fully integrated touchscreen, conveniently placed in front of the operator for fast operation and feedback immediate.
Integrated ERS patented AC3 cooling technology
These chucks incorporate ERS patented AC3 cooling technology and its air management system to purge the MPI ShielDEnvironment™ directly from "already used" air - reducing dry air consumption by up to 30-50% compared to other systems on the market.
Various choices of optics and movements
A wide range of optics are available with a choice of stereo for all common DC/CV applications or single tube high magnification microscopes for RF or load-pull configurations. High-resolution cameras for optimum comfort are also offered.
Advanced anti-vibration base or table
Shelves for measuring instruments
Safety to transform the test station into a TS200/300-HP (high power)
Probe card holder
Digital micrometers
Compressor and vacuum pump
