distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.
distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.
Fully Automatic Systems for 24/7 Production Peak Testing
The MPI TS2500 Series is not a technical test station with charger, it is explicitly designed for precise and reliable production testing, 24/7.
Main applications are DC/CV, RF, High Power testing or testing of MEMS and other sensors in a defined test environment.
The TS2500-SE incorporates MPI’s industry-leading ShielDEnvironment™ to provide unmatched light-tightness and EMI shielding for precise measurements with very low DC and RF noise.
MPI SENTIO®
Using a new approach based on simplicity and truly intuitive operation, MPI has pioneered a revolutionary probe control software suite multi-touch to meet today's challenges of operating complex probe test systems.
MPI's goal is to significantly reduce training time and make operators' lives as easy as possible, even when using the TS2500 Series fully automatic probe test stations.
High Throughput
Automation includes dual-cassette loading for 100, 150 or 200 mm wafers, enabling highly efficient wafer loading and increased test speed. The TS2500 Series can achieve a maximum speed of 10 Die/second (depending on final system configuration), making it an ideal choice for production electrical test on RF and high-power devices as well as integrated circuits (ICs).
Advanced Alignment
Advanced alignment features such as the down-facing off-axis camera and the up-facing chuck-mounted camera make the TS2000-IFE an ideal platform for testing in complex RF, mmW and SiPh measurement configurations. Decades of experience from the MPI Photonics Automation division make this option very reliable.
Wafer-ID reader is also available as an option.
Thin wafer handling
The unique design of the TS2500 chucks, dedicated cassettes and wafer lifting axes allows for safe handling of wafers up to 50 micrometers thick and thus for testing thin wafers of Ill-Vs compounds that are usually difficult to test.
ShielDEnvironment™
MPI ShielDEnvironment™ is a high performance local environmental chamber that provides an excellent EMI and light-tight shielded test environment for ultra-low noise and low capacitance measurements.
High Voltage, High Current and Ultra High Power Test Probes
MPI High Power test solutions include dedicated high current test probes that utilize MPI’s multi-contact tips for reduced contact resistance. MPI’s high voltage tips are capable of measuring low leakage currents during high voltage testing up to 3 kV triaxial or 5 kV & 10 kV coaxial, and up to 600 A.
MPI’s high-power probe card prevents arcing up to 10 kV and offers unique testing possibilities up to 150°C.
A wide range of chucks depending on the application
The TS2000-IFE is available with different chuck options to meet different budgets and application requirements.
Ambient chucks: Coaxial, Triaxial or RF with two ceramic auxiliary chucks for precise RF calibration.
Various ERS AirCool thermal chucks from -60°C to 300°C.
Various choices of optics and movements
A wide range of optics is available for all common DC/CV applications or for high-magnification digital microscopes for RF or load-pull.
Complete Test Solution
The TS2500 can be configured with MPl’s advanced RF/High Power accessories, such as Micropositioners, RF Cables, Calibration Substrates, TITAN™ RF Probes, High Power Instrument Connection Sets, Taiko Wafer Holder or Anti-Arcing LiquidTray™ to ensure safe and accurate RF/High Power measurements.
With the integration of the VNA closer to the DUT, MPI’s partnership with Rohde & Schwarz and new advanced calibration techniques, the TS2500-RF becomes a complete measurement solution that addresses the complexities of RF production test.
