AUTOMATIC PHOTONIC PROBERS

High-performance probing of laser diodes, photodetectors, optoelectronics communication devices, LEDs

• Top probing or top/bottom probing
• Wafer probing, package probing or die probing
• Low or high temperature
• Semi-automatic or full automatic
• Optical test (LIV, spectral…), electrical test (low noise, low leakage current…) and LCR test
• Low contact force of tips to prevent scratching
• Single-site or multi-site testing
• High-precision probing
• Automatic loading from 4 x 25-wafer cassettes
• Wafer up to 8