distributeur français d’équipements et consommables pour l’industrie du Semiconducteur.


High-performance probing of laser diodes, photodetectors, optoelectronics communication devices, LEDs

  • Top probing or top/bottom probing
  • Wafer probing, package probing or die probing
  • Low or high temperature
  • Semi-automatic or full automatic
  • Optical test (LIV, spectral…), electrical test (low noise, low leakage current…) and LCR test
  • Low contact force of tips to prevent scratching
  • Single-site or multi-site testing
  • High-precision probing
  • Automatic loading from 4 x 25-wafer cassettes
  • Wafer up to 8