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Manual tip test stations

All-inclusive IMPACT test stations
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MPI has developed a complete range of manual probe test stations (for wafers from 25 to 150 mm), with different possible uses (DC/CV Coax or Triax measurements, RF, THZ) including all the accessories necessary to carry out the tests. These high-quality "turnkey" solutions are offered at a very attractive price.

IMPACT™ (ITS) test solutions are complete and flexible packages. Unlike "predefined packages", IMPACT is well suited to all applications and individual requirements.
Made without compromising the quality or accuracy of the measurements.

Complete test solution
With IMPACT™, MPI provides a significant impact on the cost of test by offering very attractive prices, an easy upgrade path and a wide variety of interchangeable options. IMPACT™ meets the specific requirements of universities, public and government institutes and research centers in DC/CV or RF applications.

IMPACT™ Test Solutions (ITS) includes:

  • The basic probe test station with chuck movement.
  • The adapted chuck
  • The microscope and its movement
  • The MicroPositioners
  • The probe arms
  • The test tips
  • The cables

 

Existing IMPACT™ Test Solutions (ITS):

  • ITS25-THZ
  • ITS50-COAX
  • ITS50-RF26 up to 26 GHz
  • ITS50-TRIAX
  • ITS150-THZ
  • ITS150-COAX
  • ITS150-RF26 up to 26 GHz
  • ITS150-RF
  • ITS150-TRIAX

A wide range of chucks to suit the application:

Manual systems are available with a variety of chuck options to suit different budgets and application requirements.

  • Options include MPI coaxial or triaxial chucks or a variety of ERS thermal chucks to support temperature measurements up to 300°C, with seamless integration of the touchscreen control for quick and convenient access and operation.
  • Auxiliary chucks for RF calibration:
    The RF chucks incorporate two auxiliary chucks constructed of ceramic for precise RF calibration.
  • A variety of optics and movements: A wide range of optics are available with a choice of stereo for all common DC/CV applications or high magnification single-tube microscopes for RF or load-pull configurations. High-resolution cameras for optimum comfort are also offered.
  • Advanced anti-vibration base or table
  • Shelves for measuring instruments
  • Dark box
  • Probe card holder
  • Digital micrometers
  • Compressor and vacuum pump
Connectez-vous à notre expert
Laurent BEDDELEM
laurent.beddelem@microtest-semi.com
06.34.10.75.23

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