Test Burn In

HPB-4B High-Power Burn-In System

High-power devices have become an industry standard. The HPB-4B burn-in system meets the challenges created by wide variations in heat dissipation and the diverse burn-in requirements of high-power devices:

Individual temperature control for each device up to 600 W
Device testing at a maximum temperature of 150°C with one liquid-cooled heatsink per device.
Programmable clock with 2 nanosecond resolution and 8 sets of on-the-fly synchronization.
System capacity: 14 burn-in cards (112 devices)
12 vector formats per cycle with memory test extensions
19 programmable voltage regulators delivering 2060 amperes per burn-in card.
Programmable high-speed clock up to 800 MHz
128 I/O signals per card
64M vector memory, 8G scan

HPB-5C+ Burn-In System: The industry standard for high-power circuits The HPB-5C+ test and burn-in system meets the challenges created by the wide variation in thermal dissipation and the diverse burn-in requirements of high-power VLSI devices. The active thermal control function provided by the HPB-5C+ ensures that the appropriate thermal stress is applied to each device during the burn-in cycle.

Individual temperature control for each device up to 150 W
Variable oven overflow control
Individual burn-in zone
32M vector memory as standard, 64M optional
Tests devices at temperatures up to 150°C
Clock frequency up to 800 MHz
128 digital I/O channels per burn-in card
System capacity: 384 devices under test with individual temperature control per device.
16 programmable voltage regulators with 1080 amperes of device power under test per burn-in card
8 high-current power supplies (0-4 volts at a maximum of 125 amps each)
8 low-current power supplies (0-6 volts at a maximum of 10 amps each)

The LC-2+ Burn-In system: production burn-in and individual temperature control The LC-2+ is a sophisticated burn-in system that meets advanced requirements thanks to its ability to perform dynamic burn-in with test. The LC-2+ is ideally suited to technical characterization, service life testing and production control applications. The main function of the LC-2+ is to provide appropriate temperature, voltage and current conditions to identify device functionality during burn-in.

Large capacity: 64 burners
Individual temperature control up to 50 watts, compatible with a wide range of BIB sizes
128 or 256 digital I/O channels per burn-in card
5 individually programmable power supplies (up to 400 watts and 248 amps) per burn-in card.
Up to 150 volts of power outputs
Up to 32 configuration and supply zones
Total flexibility up to 8M vector memory with BIB scanning capability

The Burn-In LC-2 Automation system: Next-generation automation

The new-generation LC-2 Automation system is ideally suited to technical characterization, life testing and running-in applications in commercial production.

The machine can operate in two modes:
- Fully automated
- Manual operation
Automated sliding door
BIB rack positioning system
Automated BIB loading and ejection
Standard safety circuit features include
- Immaterial barriers
- Door bumpers
- Position sensors

Test Burn In

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