Probe Testing: Probe Cards – T40 and T90 Series
Tip Cards – T40 and T90 Series
Browse the products in the range
Application
SERIE T40:
Achieve low leakage, low noise, and wide operating temperature range measurements with the industry standard 4.5’’ T40™ probe board. Patented ceramic holds the tips in place and ensures peak electrical performance in a variety of test environments. The T40™ board is impact resistant - the tips stay aligned in the event of a crash, unlike other boards where the tips become crushed.
The T40™ is available in high temperature, Quasi-Kelvin and AttoFast™ versions for ultra-fast femto-ampere adjustment in one second. The T40™ tip board is optimized to provide the most accurate, low-leakage, fast-stabilizing, low-noise measurements over a wide temperature range.
SERIE T90:
Multi-site modeling and characterization, wafer-level reliability, and burn-in T90 Series probe boards are compatible with industry-standard 4.5" rails, but can be configured with up to 500 probes for testing. Dense multi-site reliability at the silicon wafer level. With an effective operating temperature range of -65° to 300° [400°C optional], T90 probe cards can provide reliable and accurate low leakage test data. The T90 probe card is a durable, reliable and robust solution for high-density wafer-level reliability testing, while being compact and easy to use with a variety of test platforms.
Specifications
T40:
Ultra-low noise, rapid setup modeling and characterization testing is made possible with Celadon's patented ceramic tip boards.
T40™LL, T40™HT, T40™AF, T40™LLIC, T40™AFIC
The T40 was designed to be mounted on a standard 4.5″ tip card holder. The 1.6 mm (0.062″) thick rails allow the chassis to slide into adjustable planarity tip card holders for most analytical test stations.
- 40 millimeter ceramic tip card Optimized for DC parametric and single-site WLR testing
- Compatible with standard 4.5″ rectangular card holders.
- Temperature compensated for use from 65°C to 300°C
- Temperature extension option up to 600°C
- Leakage measurements down to fA level available
- Compatible with quick-disconnect triaxial cable harnesses
- Quasi-Kelvin connections available
- Multiple connector options available
T90™ with Advanced Cantilever™ Series Probe Card:
The 90 mm ceramic was designed to be mounted on a standard 4.5″ probe card holder for multi-site wafer-level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slide into adjustable planarity probe card holders for most analytical probe stations.
- 90 millimeter ceramic tip card
- Optimized for multi-site DC parametric and multi-site WLR testing
- Compatible with standard 4.5″ rectangular card holders.
- Temperature compensated for use from -65°C to 300°C
- fA level leakage measurements
- Compatible with Celadon quick-disconnect triaxial cable braids
- Quasi-Kelvin connections available
- Multiple connector options available
Complementary Products
Celadon Cables:
The cables are designed and manufactured by Celadon. Cables are available in custom lengths up to half a meter and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sleeving may be used to prevent wire wear.
